Fig. 3From: Yield gains and associated changes in an early yellow bi-parental maize population following genomic selection for Striga resistance and drought tolerancePath analysis model diagram showing causal relationships of measured traits of early yellow testcrosses evaluated across artificial Striga infestation at Mokwa and Abuja, 2014. Bold values are residual effect; values in parenthesis are direct path coefficient and other values are correlation coefficients. R1 is the residual effects; ASI, anthesis–silking interval; DA, days to 50% anthesis; DS, days to 50% silking; EASP, ear aspect; EHT, ear height; EPP, ears per plant; EROT, ear rot; ESP 1 and ESP 2, emerged Striga plants (8 and 10 WAP); HC, husk cover; PLHT, plant height; RL, root lodging; SDR 1 and SDR 2, Striga damage (8 and 10 WAP); SL, stalk lodging and YIELD, grain yieldBack to article page