Fig. 4From: Prediction and analysis of three gene families related to leaf rust (Puccinia triticina) resistance in wheat (Triticum aestivum L.)RNA-seq expression profiles of ABC, NLR and START genes in resistant (R) wheat line (Avocet-Yr5) and susceptible (S) wheat cultivar (Vuka) inoculated with yellow rust pathogen Puccinia striiformis f. sp. tritici (Pst) during 5 and 11Â days post inoculation, respectively. Abbreviations: DPI, days post inoculation; TPM, number of transcripts per million reads; R_ABC, ABC gene expression in resistant wheat; R_NLR, NLR gene expression in resistant wheat; R_START, START gene expression in resistant wheat; S_ABC, ABC gene expression in susceptible wheat; S_NLR, NLR gene expression in susceptible wheat; S_START, START gene expression in susceptible wheatBack to article page