Figure 5From: Genome-wide association for grain morphology in synthetic hexaploid wheats using digital imaging analysisManhattan plots of P values indicating genomic regions associated with four grain morphology traits a) thousand kernel weight, b) grain length, c) grain width, and d) grain thickness. x- axis shows DArT markers along each wheat chromosome; y- axis is the –log10 (P-value), horizontal lines designate 1E-03 thresholds for highly significant associations. The association of genes TaSus-B1 (c) and TaCKX-D1 (d) with grain width and thickness are shown by black arrows, respectively.Back to article page