Figure 3From: Genome-wide association for grain morphology in synthetic hexaploid wheats using digital imaging analysisScatterplot of the LD statistic r2as a function of genetic distance (cM) between pairs of DArT markers in SHWs. The locally weighted polynomial regression-based (LOESS) representing decay of r2 along genetic distance is illustrated for each genome. LD critical threshold estimated from LD distribution of pairs of unlinked DArT markers is indicated by the dashed horizontal line.Back to article page