Skip to main content
Figure 3 | BMC Plant Biology

Figure 3

From: Genome-wide association for grain morphology in synthetic hexaploid wheats using digital imaging analysis

Figure 3

Scatterplot of the LD statistic r2as a function of genetic distance (cM) between pairs of DArT markers in SHWs. The locally weighted polynomial regression-based (LOESS) representing decay of r2 along genetic distance is illustrated for each genome. LD critical threshold estimated from LD distribution of pairs of unlinked DArT markers is indicated by the dashed horizontal line.

Back to article page

BMC Plant Biology

ISSN: 1471-2229

Contact us