Characterization of non-host resistance in broad bean to the wheat stripe rust pathogen

BMC Plant Biology

Table 1 No significant differences in fungal growth among two broad bean cultivars in regard to their interactions with three different races of P . striiformis f. sp. tritici

Broad bean	Linear length of infection hyphae (μm)
Broad bean	CYR23	CYR31	CYR32
Yuxidabaidou ⁽¹⁾	55.47 ± 1.40	54.73 ± 1.21	54.95 ± 1.12
Linxiadacaidou ⁽²⁾	54.97 ± 0.98	55.07 ± 0.85	54.29 ± 1.23

⁽¹⁾ one main broad bean cultivar grown in Yunnan, China.
⁽²⁾ one broad bean cultivar grown in Gansu, China.
The linear length of infection hyphae (from the substomatal vesicle to the apex of the longest infection hypha) were measured by microscopy at nine days post-inoculation. Data are mean ± standard deviation, and there is no statistical difference (P > 0.05) compared by Student t tests.

ISSN: 1471-2229