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Table 1 No significant differences in fungal growth among two broad bean cultivars in regard to their interactions with three different races of P . striiformis f. sp. tritici

From: Characterization of non-host resistance in broad bean to the wheat stripe rust pathogen

Broad bean Linear length of infection hyphae (μm)
CYR23 CYR31 CYR32
Yuxidabaidou (1) 55.47 ± 1.40 54.73 ± 1.21 54.95 ± 1.12
Linxiadacaidou (2) 54.97 ± 0.98 55.07 ± 0.85 54.29 ± 1.23
  1. (1) one main broad bean cultivar grown in Yunnan, China.
  2. (2) one broad bean cultivar grown in Gansu, China.
  3. The linear length of infection hyphae (from the substomatal vesicle to the apex of the longest infection hypha) were measured by microscopy at nine days post-inoculation. Data are mean ± standard deviation, and there is no statistical difference (P > 0.05) compared by Student t tests.